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IEC61032 IP Testing Equipment Jointed Test Finger For Safety Test IP2 Test Probe B

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IEC61032 IP Testing Equipment Jointed Test Finger For Safety Test IP2 Test Probe B

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Brand Name : HongCe

Model Number : HT-I02

Certification : Calibration certificate(cost additional)

Place of Origin : China

MOQ : 1 set

Price : Negotiatable

Payment Terms : T/T

Supply Ability : 30 sets per month

Delivery Time : 3 days

Packaging Details : Aluminum box

product name : The Standard Test Finger Probe / The Standard Test Knurled Finger Probe / Test Probe B / IP2X Protection Grade Probe

Knurled Finger Diameter : 12mm

Knurled Finger Length : 80mm

Standards : IEC61032, IEC60529

Fingertip cutting bevel angle : 37°

Fingertip taper : 14°

Baffle Plate Diameter : 50mm

Baffle Plate Length : 100mm

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IEC61032 IP Testing Equipment Jointed Test Finger for Safety Test IP2 Test Probe B

Product information for IP Testing Equipment:

Jointed Test FingerJointed test finger is used to verify protection of persons against access to hazardous live parts or hazardous mechanical parts.

In the test requirements of preventing from approaching to the hazardous parts, the probe B test probe needs to with a 30N thrust. The product without force should be used with push-pull dynamometers.
In the test of against electric shock, wiring ,configuration and power and indicating device are needed. Turn on the power of the tested sample, and exert the corresponding force to determine whether the grounding line are connected

Standard for IP Testing Equipment:

IEC 60529: 2013 Degrees of protection provided by enclosures (IP Code), IEC61032 figure 2

Application for IP Testing Equipment: It is applied to verification of basic protection against human access to hazardous parts, and it is also for protection against fingers.

Feature for Jointed Test Finger:

Name: Jointed Test Finger

Norme: IEC 61032 fig. 2 Probe B

Finger Probe – Stainless Steel Alloy
Hand, top face & handle – nylon with excellent dielectric resistance

Parameters(mm):

Model HT-I02
Name Standard Test Finger
Joint 1 30±0.2
Joint 2 60±0.2
Finger length 80±0.2
Fingertip to baffle 180±0.2
Cylindrical R2±0.05
Spherical R4±0.05
Fingertip cutting bevel angle 37°
Fingertip taper 14°
Test finger diameter Ф12
A-A Section diameter Ф50
A-A Section width 20±0.2
Baffle diameter Ф75±0.2
Baffle thickness 5±0.5
Force ----
Applied standard IEC61032-1

IEC61032 IP Testing Equipment Jointed Test Finger For Safety Test IP2 Test Probe B

Product detail picture:

IEC61032 IP Testing Equipment Jointed Test Finger For Safety Test IP2 Test Probe B


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